JPH0478929B2 - - Google Patents

Info

Publication number
JPH0478929B2
JPH0478929B2 JP61109244A JP10924486A JPH0478929B2 JP H0478929 B2 JPH0478929 B2 JP H0478929B2 JP 61109244 A JP61109244 A JP 61109244A JP 10924486 A JP10924486 A JP 10924486A JP H0478929 B2 JPH0478929 B2 JP H0478929B2
Authority
JP
Japan
Prior art keywords
measurement
axis direction
measured
detector
detectors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61109244A
Other languages
English (en)
Japanese (ja)
Other versions
JPS62265520A (ja
Inventor
Matsushiro Fujitani
Ichiro Kumagai
Ichiro Mizuno
Eiichi Tsunoda
Koji Yoda
Tomoji Nakayama
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitutoyo Corp
Original Assignee
Mitutoyo Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitutoyo Corp filed Critical Mitutoyo Corp
Priority to JP10924486A priority Critical patent/JPS62265520A/ja
Publication of JPS62265520A publication Critical patent/JPS62265520A/ja
Publication of JPH0478929B2 publication Critical patent/JPH0478929B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices With Unspecified Measuring Means (AREA)
JP10924486A 1986-05-12 1986-05-12 ２つの検出子を備えた三次元測定機 Granted JPS62265520A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10924486A JPS62265520A (ja) 1986-05-12 1986-05-12 ２つの検出子を備えた三次元測定機

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10924486A JPS62265520A (ja) 1986-05-12 1986-05-12 ２つの検出子を備えた三次元測定機

Publications (2)

Publication Number Publication Date
JPS62265520A JPS62265520A (ja) 1987-11-18
JPH0478929B2 true JPH0478929B2 (en]) 1992-12-14

Family

ID=14505268

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10924486A Granted JPS62265520A (ja) 1986-05-12 1986-05-12 ２つの検出子を備えた三次元測定機

Country Status (1)

Country Link
JP (1) JPS62265520A (en])

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8654351B2 (en) 2009-10-13 2014-02-18 Mitutoyo Corporation Offset amount calibrating method and surface profile measuring machine
US8650939B2 (en) 2009-10-13 2014-02-18 Mitutoyo Corporation Surface texture measuring machine and a surface texture measuring method

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
ATE314628T1 (de) * 2001-07-16 2006-01-15 Werth Messtechnik Gmbh Verfahren zur messung von oberflächeneigenschaften sowie koordinatenmessgerät
US7921575B2 (en) * 2007-12-27 2011-04-12 General Electric Company Method and system for integrating ultrasound inspection (UT) with a coordinate measuring machine (CMM)
JP5740084B2 (ja) * 2008-12-09 2015-06-24 株式会社東芝 タービン発電機におけるステータコイルの接続組立の３次元形状測定方法及び３次元形状測定装置用冶具
JP5378940B2 (ja) * 2009-10-13 2013-12-25 株式会社ミツトヨ 表面性状測定機および表面性状測定方法
JP5260703B2 (ja) * 2011-06-10 2013-08-14 パナソニック株式会社 ３次元測定方法
JP6767843B2 (ja) * 2016-11-02 2020-10-14 株式会社キーエンス 画像測定装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS53146656A (en) * 1977-05-26 1978-12-20 Nec Corp Outside shape measuring apparatus
JPS5634042A (en) * 1979-08-23 1981-04-06 Toshiba Corp Filter for use in ventilator
JPS5773604A (en) * 1980-10-27 1982-05-08 Sumitomo Metal Ind Ltd Measuring device for height of reinforcement of weld
JPS5866004A (ja) * 1981-10-14 1983-04-20 Nissan Motor Co Ltd 三次元形状の測定方法
US4523450A (en) * 1981-11-07 1985-06-18 Carl-Zeiss-Stiftung, Heidenheim/Brenz Method of calibrating probe pins on multicoordinate measurement machines
JPS60107186A (ja) * 1983-11-15 1985-06-12 Hitachi Ltd 物体認識装置
JPS60161523A (ja) * 1984-02-02 1985-08-23 Mitsutoyo Mfg Co Ltd 三次元測定機
JPS60171409A (ja) * 1984-02-16 1985-09-04 Sumitomo Metal Ind Ltd 管ネジ部肉厚測定装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8654351B2 (en) 2009-10-13 2014-02-18 Mitutoyo Corporation Offset amount calibrating method and surface profile measuring machine
US8650939B2 (en) 2009-10-13 2014-02-18 Mitutoyo Corporation Surface texture measuring machine and a surface texture measuring method

Also Published As

Publication number Publication date
JPS62265520A (ja) 1987-11-18

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